#ifndef TEST_TLX493D_GEN_3_COMMON_H
#define TEST_TLX493D_GEN_3_COMMON_H


// std includes
#include <string.h>

// test includes
#include "Test_includes.h"


// Variables used in the tests below that have to be accessed in the setup and tear down methods.
// The "dut" variable is taken from the respective sensor that the common functions are applied to.


// define test group name
// TEST_GROUP(SensorsGen3Common);


// // Setup method called before every individual test defined for this test group
// static TEST_SETUP(SensorsGen3Common)
// {
// }


// // Tear down method called before every individual test defined for this test group
// static TEST_TEAR_DOWN(SensorsGen3Common)
// {
// }


// // Define all relevant tests for the sensor device
// TEST_IFX(SensorsGen3Common, dummy)
// {
//     TEST_ASSERT( true == !false );
// }


// Bundle all tests to be executed for this test group
static TEST_GROUP_RUNNER(SensorsGen3Common)
{
    // RUN_TEST_CASE(SensorsGen3Common, dummy);
}


#endif // TEST_TLX493D_GEN_3_COMMON_H
